Thermal-Aware Testing of Digital VLSI Circuits and SystemsКНИГИ » ЭЛЕКТРОНИКА
Название: Thermal-Aware Testing of Digital VLSI Circuits and Systems Автор: Santanu Chattopadhyay Издательство: CRC Press Год: 2018 Страниц: 138 Формат: True PDF Размер: 10 Mb Язык: English
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
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Thermal-Aware Testing of Digital VLSI Circuits and Systems 
